 Connecting Devices / Press System
For Fast diodes
IGBT- mosfet Power Modules ipm
Lemsys PRO
Portable Test Equipment
Rectifiers – Thyristors – GTO – Triacs
Test Generator
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Friday 4 July 2008
News
LEMSYSpro demonstration
From now on a high productivity static tester for thyristor, diode, IGBT, MOSFET, power module, varistor and other devices is available for demonstration at our production site in Geneva. It executes 10 or more tests per second and is easy to use. The reliabilty, combined with auto test features simplify the maintenance of the product. Its low investment costs qualify it even for limited budgets. Contact us for further information.
QRR Measuring Unit
On April 2004, the second high di/dt QRR measuring unit has been delivered to the customer for QRR measurements on diodes with up to 100A at 1000A/µs.This new module is used with our standard DMS (diode measurement system). Contact us for further information.
Wafer Prober:
The new LEMSYSpro can be connected to almost any Wafer Prober. It tests static parameters of chips, breakdown voltage , leakage current and forward voltage drop of diodes, thyristors or IGBT in less than 1sec. per chip. With corresponding prober modification, tests up to 2000V can be made on the Wafer. Other wafer tests are available upon request. Adequate Software for Wafer Mapping and statistics, ATE Data Analysis, can be provided too. |
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