| DYNAMIC AND STATIC SEMICONDUCTOR TEST SYSTEMS | PRODUCT FAMILIES | | Modular based IGBT, MOSFET, Power module, IPM dynamic and static test equipment. | TRd, TRs, TRds family | High throughput production static test equipment for IGBT, MOSFET, Diode, Thyristor, Triac and others
| LEMSYSpro family
| Diode dynamic test equipment
| DMS | Thyristor and Diode dynamic test equipment
| Tq family
| | Thyristor and Diode static test equipment | Stc family | | GTO static and dynamic test equipment | GTO family
| | MAINTENANCE AND LOW/MEDIUM PRODUCTION TEST EQUIPMENT | | Portable test equipment
| TP0620 | Forward voltage test equipment
| I30, I60, I90
| Leakage current test equipment
| U60, U100
| | DEVICE CONNECTING SYSTEMS | | Test bloc for power modules and IPM
| BTM | Presses for press pack devices
| 40kN, 50kN, 100kN, 150kN, 200kN
| | MEASURING SHUNTS | ISM, WSM families
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Development and realisation of dedicated equipments
 With a deep knowledge of power electronics, measuring techniques and the associated components, the LEMSYS engineering team has realised several dedicated equipments for various application domains. 
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